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Examination of dielectric response of Au/HgS-PVA/n-Si (MPS) structure by impedance spectroscopy method
(Elsevier Science, 2019)
HgS-PVA nanoparticles were obtained via a simple ultrasound-assisted method. The structural and morphological characteristics of the products were analyzed by X-ray diffraction (XRD) and Scanning Electron Microscopy (SEM). ...