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Frequency, voltage and illumination interaction with the electrical characteristics of the CdZnO interlayered Schottky structure
(Springer, 2019)
cadmium-zincoxide (CdZnO) interlayered metal-semiconductor structure was examined by capacitance and conductance versus voltage data in dark and under 250W illumination at 100kHz, 500kHz and 1MHz frequencies, respectively. ...
Examination of dielectric response of Au/HgS-PVA/n-Si (MPS) structure by impedance spectroscopy method
(Elsevier Science, 2019)
HgS-PVA nanoparticles were obtained via a simple ultrasound-assisted method. The structural and morphological characteristics of the products were analyzed by X-ray diffraction (XRD) and Scanning Electron Microscopy (SEM). ...